Effects of Cu contamination on the electrical properties of multicrystalline silicon purified by dir

来源 :2014中国功能材料科技与产业高层论坛 | 被引量 : 0次 | 上传用户：yaqi007666

【摘要】

：

The multicrystalline silicon wafers purified by directional solidification route were used to introduce copper impurities.The resistivity and minority carrier lifetime of multicrystalline silicon wafe

【作者】

：

Li Jiao Chen Xiu-hua Ma Wen-hui Zhang Cong Wei Kui-xian

【机构】

：

Faculty of Physical Science and Technology, Yunnan University, Kunming 650091, China

【出处】

：

2014中国功能材料科技与产业高层论坛

【发表日期】

：

2014年2期

【关键词】

：

multicrystalline silicon Copper contamination minority carrier lifetime resistiv

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Effects of Cu contamination on the electrical properties of multicrystalline silicon purified by dir

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