• 不 限
  • 期刊论文
  • 硕博论文
  • 会议论文
  • 报 纸
  • 英文论文
  2. 您的位置
  3. 首页
  4. 会议论文
  5. Scanning Probe Microscopy in Nanometrology

Scanning Probe Microscopy in Nanometrology

来源 :International Conference on Nanoscience & Technology,China 2 | 被引量 : 0次 | 上传用户：Xinigami
【摘 要】
：
Scanning probe microscopy (SPM) had been recognized as an imaging technology with an atomic resolution since scanning tunneling microscopy was first introduced in 1981.Since then its capabilities have
【作 者】
：
Haeseong Lee 
【机 构】
：
Department of Nanomaterials Engineering Jeonju University,Jeonjt,Republic of Korea 560-759,Chair of
【出 处】
：
International Conference on Nanoscience & Technology,China 2
【发表日期】
：
2013年3期
【关键词】
：
scanning probe microscopy atomic force microscopy nanocharacterization metrology 
下载到本地 , 更方便阅读
下载此文 赞助VIP
声明 : 本文档内容版权归属内容提供方 , 如果您对本文有版权争议 , 可与客服联系进行内容授权或下架
论文部分内容阅读
　　Scanning probe microscopy (SPM) had been recognized as an imaging technology with an atomic resolution since scanning tunneling microscopy was first introduced in 1981.Since then its capabilities have been expanded due to invention of an atomic force microscope in 1986, a near-field scanning optical microscope (or a scanning near-field optical microscope) in 1988.This novel technology is now strengthened with more than 30 SPM-based methodologies.Hence SPM and the related methodologies now cover the wide areas such as microscopy, spectroscopy, nanofabrication and so on.Even though SPM is plays an essential role in nanotechnology, it shows a disadvantage in measuring an absolute measurand for metrology.
其他文献
Prediction Approach for Failure of Tailings Dam
Tailings dam is a man-made potential source of debris flow which will cause a disaster once the dam being broken.This rate and amount of tailings released directly impact the hazard to life and proper
会议
Tailings damRetrogressive erosionPrediction modelVolume of dam failure
Probing the Structure and Dynamics of Ferroelectric Domains with Atomic Resolution in Real-Time
In this talk, I will show that the atomic scale polarization map in ferroelectrics can be determined using aberration-corrected TEM images owing to the large atomic displacements responsible for the d
会议
Aberration-corrected TEMin situ TEMferroelectricdomain wallsdomain switching
In-situ TEM technique and its applications on nano research
In-situ transmission electron microscopy (TEM) method is powerful in a way that it can directly correlate the atomic-scale structure with physical and chemicai properties.In this presentation, we will
会议
in-situ TEM methodnanocharacterizationelectrical propertyoptical propertyion
Quantum control of metal/semiconductor hybrid systems: from atomic layer superconductivity to deep s
The ability to control, with atomic precision, heterostructures comprising two dissimilar electronic materials has provided us with an unprecedented opportunity: to tailor novel low-dimensional electr
会议
quantum structuressuperconductivitynanoplasmonics
In situ measurement of localized surface plasmon resonance of metal nanoparticles in different surro
The strong interactions of metal nanoparticle localized surface plasmon resonances (LSPR) with their immediate environment have applications in fields ranging from catalysis to medicine.Understanding
会议
Surface plasmonshape controlled nanoparticleselectron energy-loss spectroscopy
Stationary Vs.Non-stationary of Extreme Rainfall in Dar Es Salaam (Tanzania)
Increasing flood risk is now recognized as one of the most important threats from climate change in most parts of the world, with recent repeated severe flooding causing major loss of property and lif
会议
Hydrological processesStationary modelingNon-Stationary modelingBayesian anal
Development of Standard Methods to Characterize Nanomaterials for robust Nanosafety Evaluation
Safety issue of nanomaterials on environment and human health becomes more and more emphasized along with the increase of nanoproducts on the market.OECD WPMN and ISO/TC 229, which are highly involved
会议
NanomaterialStandard TechniquesNanosafety
Novel Methods for Nanoparticle Sizing
To measure the size of nanoparticles in-situ and in-line has much helpful for the research, manufacturing and application of nanoparticles.Some measurement techniques, such as PCS, SEM, TEM have been
会议
dynamic light scatteringultrasonicnanoparticle sizingimage method
Standards to support the fabrication of nano-enabled electrical and electronic products
The IEC technical committee 113 (IEC/TC 113) "Nanotecllology standardization for electrical and electronic products and systems" [1] develops standards supporting fabrication of nano-enabled electrote
会议
Standardsnano-enabled productsmaterial specificationskey control characterist
Accurate and traceable nano dimensional metrology using AFM technique
The subject of this paper is to introduce the research on nano dimensional metrology using the atomic force microscopy (AFM) technique at the PTB — the national metrology institute of Germany.Calibrat
会议
Nano dimensional metrologymetrological atomic force microscopytransmission ele