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本文介绍了一套基于直流电位法的Apple-Ⅱ微机疲劳裂纹扩展的数据采集与处理系统。该系统具有电位采集和裂纹监测,绘出da/dN～⊿a和da/dN～⊿K曲线,求出Paris公式da/dN=A(⊿K)~m中参数A,m的功能。附录中给出了一个完整的应用实例。
This paper introduces a set of data acquisition and processing system based on the DC potential method for Apple-Ⅱ microcomputer fatigue crack growth. The system has potential acquisition and crack monitoring, draw da / dN ~ ⊿a and da / dN ~ ⊿ K curve, find Paris function da / dN = A (⊿K) ~ m parameters A, m function. The appendix gives a complete application example.