论文部分内容阅读
Electrical mapping and structure analysis of lowtemperature tolerance related genes in Soybean (Glyc
【机 构】
:
The Crop Research and Breeding Center of Land-Reclamation,Harbin 150090,China;Agriculture College,No
【出 处】
:
第八届世界大豆研究大会暨第九届全国大豆学术讨论会
【发表日期】
:
2009年12期
其他文献
Analysis soybean breeding progress during past 85 years in Jilin province according to records of cu
Difference of photosynthetic tolerance to phiotooxidation among soybean varieties (lines) and relati