【摘 要】
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Atomic force microscopy(AFM)has become a standard for high-resolution structural analysis of samples ranging from single molecules to complex macromolecular systems.A number of new developments in the
【机 构】
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JPK Instruments AG,Berlin 12099,Germany JPK Preci
【出 处】
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The 6th International Conference on Nanoscience and Technolo
论文部分内容阅读
Atomic force microscopy(AFM)has become a standard for high-resolution structural analysis of samples ranging from single molecules to complex macromolecular systems.A number of new developments in the last years have helped to overcome the limitation of conventional AFM setups,and enabled the analysis of sensitive and dynamic processes,taking place on the millisecond timescale.The much faster phase response in phase modulation AFM(PM-AFM)compared to amplitude modulation AFM(AM-AFM),makes possible the application of very small forces and amplitudes of approximately 1-2 (A).We will demonstrate the ease of use of a commercially available PM-AFM setup(HyperDriveTM from JPK Instruments)to achieve submolecular resolution on very soft samples,as well as atomic resolution on muscovite mica,simultaneous to fast scanning.
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