Multi-dimensional Scanning at Atomic Scale

来源 :International Conference on Nanoscience & Technology,China 2 | 被引量 : 0次 | 上传用户:yuhuafenghao
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  Under the support of Framework Program 7 of the European Union we were involved in the development of Multi-dimensional scanning probe microscope in cooperation with EMPA, Createc and NanoScan.This new system allows for the flexural and torsional modes in AFM plus tunneling current to be measured in parallel with topography, frequency shift, phase, excitation, damping, and probe deflection.
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