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50项智能测查量表是上海儿研所郭迪教授发起的全国儿童智能研究协作组拟定的智能测查方案。它是一种综合性的能力筛查方法,适用4～7岁儿童。在美国将此测查作为儿童入学能力测验。为研究此智能测查方法在本地区是否适用,于1986年11月和1987年6月两次对百色城2所小学学前班儿童进行50项智能测查,并随访了解入学后5个学期的学习成绩,现将测查与学习成绩的关系分析如下:
50 intelligent questionnaire was launched by Shanghai Institute of Childhood Professor Guo Di intelligent research program developed by the National Cooperative Group for Children’s intelligence. It is a comprehensive ability screening method for children aged 4 to 7 years. In the United States this test as a children’s ability to enter the test. In order to study the applicability of this smart test method in the region, 50 smart tests were conducted on two primary preschool children in Baise City in November 1986 and June 1987, and followed up for 5 semesters of study Grades, now the relationship between test and academic performance analysis is as follows: