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在通常的硅酸盐矿物中,硅为四面体配位。但在下地幔的高温高压条件下(大于10GPa),硅主要为八面体配位。此外,八面体配位的硅也出现在某些合成硅酸盐化合物中。X射线晶体结构分析、红外和Raman光谱是研究硅在无机结晶物质中的配位与位置对称性的常规方法。但在过去的15年里,魔角自旋核磁共振谱已成为研究硅在硅酸盐矿物和其他无机材料中配位与局部结构的最有效方法。最近也有文献报道了用硅的K边X射线吸收谱和电子能量损失谱研究硅的配位。本文采用了同步辐射作光源得到的硅K边X射线吸收光谱来研究硅在硅酸盐矿物和无机材料中的配位与局部结构。
In common silicate minerals, silicon is tetrahedrally coordinated. However, under the conditions of high temperature and high pressure in the lower mantle (greater than 10 GPa), silicon mainly octahedral coordination. In addition, octahedral coordination silicon is also present in some synthetic silicate compounds. X-ray crystal structure analysis, infrared and Raman spectroscopy is a conventional method to study the coordination and positional symmetry of silicon in inorganic crystalline materials. However, in the past 15 years, magic angle spin nuclear magnetic resonance spectroscopy has become the most effective method to study the coordination and local structure of silicon in silicate minerals and other inorganic materials. Recently, it has also been reported that the coordination of silicon is studied by K-side X-ray absorption spectroscopy and electron energy loss spectroscopy of silicon. In this paper, synchrotron radiation as a source of silicon K-edge X-ray absorption spectroscopy was used to study the coordination and local structure of silicon in silicate minerals and inorganic materials.