一第二届全国集成电路测试学术会于一九八二年十月四日至十日在杭州市举行。会议是由中国电子学会电子测量与仪器学会、北京电子学会半导体专业委员会自动测试分会和杭州电子学会联合举办的。会议由中国电子学会电子测量与仪器学会副主任委员贺铭琛同志主持,国家科委华光盈同 A Second National Conference on the Testing of Integrated Circuits was held in Hangzhou from October 4 to October 10, 1982. The meeting was jointly organized by the Institute of Electronic Measurement and Instrumentation of the Chinese Institute of Electronics, the Automatic Test Branch of Semiconductor Professional Committee of Beijing Institute of Electronics and the Hangzhou Institute of Electronics. The meeting was chaired by He Mingchen, vice chairman of the Institute of Electronic Measurement and Instrumentation of the Chinese Institute of Electronics. Huateng Ying Tong