论文部分内容阅读
用功率稳定度为0.05％的He—Ne激光与MC68000单板机组成的CCD参数测量系统,对CCD的光响应非均匀性进行了测量,实现了CCD光响应非均匀性的自动测量。
A CCD parameter measurement system composed of He-Ne laser and MC68000 single-board power stabilizer with a power stability of 0.05% was used to measure the non-uniformity of the light response of the CCD, thus realizing the automatic measurement of the non-uniformity of the CCD light response.