中国科学院上海冶金研究所研制成功微量氧测定仪(Ⅰ型),并于1981年12月28日在冶金所举行了技术鉴定会。高等院校、科研及工厂等20个单位参加,会议代表在现场对仪器进行了测试考核,结果表明该仪器性能良好。其主要性能技术指标达到:最低检测下限为0.005 ppm O_2、空白为0.001～0.002 The Shanghai Institute of Metallurgy, Chinese Academy of Sciences, the successful development of trace oxygen analyzer (Ⅰ), and in December 28, 1981 held in Metallurgical Institute of Technology appraisal. 20 institutions including universities, research institutes and factories participated in the conference. Representatives of the conference conducted a test on the instrument at the scene and the results showed that the instrument performed well. Its main performance technical indicators to achieve: the minimum detection limit of 0.005 ppm O_2, a blank for 0.001 ~ 0.002