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本工作采用0.4 mm宽的窄电离带,减小了由于电离带表面高温热辐射引起的本底干扰。在电离带和样品带的加热电流分别为4.0 A和1.8 A条件下,用5μg氧化铁样品可以获得10~(-13)A稳定的离子束流近1小时。用这种方法测定了电磁分离器生产的各种浓缩铁同位素产品的丰度,测定精度为0.1%。
This work uses a narrow ionization tape of 0.4 mm width to reduce background interference caused by high temperature thermal radiation on the surface of the ionization belt. A stable ion beam of 10- (-13) A was obtained for nearly 1 hour with 5 μg of iron oxide sample at 4.0 A and 1.8 A heating currents for the ionization and sample strips, respectively. This method was used to measure the abundance of various iron concentrates produced by the electromagnetic separator with an accuracy of 0.1%.