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利用近空间升华法在经过不同打磨处理的玻璃衬底上制备了CdTe薄膜,用X射线衍射仪,扫描电镜表征了CdTe薄膜的微结构。结果表明CdTe薄膜的微观结构依赖于衬底粗糙度,(111)晶面的择优取向随衬底表面粗糙度的增加而降低。
CdTe thin films were prepared on glass substrates polished by near-space sublimation. The microstructures of CdTe films were characterized by X-ray diffractometry and scanning electron microscopy. The results show that the microstructure of CdTe film depends on the roughness of the substrate. The preferred orientation of the (111) plane decreases with the increase of substrate surface roughness.