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提出了一种提高16位逐次逼近(SAR)A/D转换器精度的熔丝误差修调技术。该技术用于提高A/D转换器内部核心模块—16位DAC的精度,从而达到提高整个A/D转换器精度的目的。电路采用标准CMOS工艺流片。测试结果显示,熔丝误差修调后,常温下,电路的INL为2.5 LSB,SNR为88.8 dB,零点误差EZ为1.1 LSB;修调后,A/D转换器有效位数ENOB从12.56位提高到14.46位。
A fuse error trimming technique is proposed to improve the precision of a 16-bit successive approximation (SAR) A / D converter. The technology is used to improve the accuracy of the 16-bit DAC, which is the core module of the A / D converter, so as to improve the accuracy of the entire A / D converter. Circuit using standard CMOS process flow film. The test results show that after the fuse error is trimmed, the INL of the circuit is 2.5 LSB, the SNR is 88.8 dB and the zero error EZ is 1.1 LSB at room temperature. After the trimming, the ENOB of the A / D converter is increased from 12.56 bits To 14.46.