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在首饰行业中,当金属覆盖层与基体材料不同时,使用X射线荧光光谱法(本文简称XRF)[1]可以对多层金属覆盖层进行材料分析并测试其覆盖层的线性厚度。本文对测试首饰中金属覆盖层的厚度过程进行不确定度评定,分析不确定度来源,对各个分量进行合成和扩展,最终给出评定的结果。
In the jewelry industry, X-ray fluorescence spectroscopy (herein referred to as XRF) [1] allows material analysis of multi-layer metal coatings and testing of the linear thickness of their coatings when the metal coating is not the same as the base material. In this paper, we evaluate the uncertainty of the thickness of the metal cover in the test jewelery, analyze the sources of the uncertainty, synthesize and expand each component, and finally give the result of the evaluation.