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本刊97年第4期《铃流信号简易不得》一文,谈到用峰值90V、50Hz电源作电话振铃测试,笔者担心会影响机内元件寿命、损坏元件的可能。以HA868(Ⅲ)P/TSD振铃电路为例说明如下。如图所示。(1)隔直电容C在f=25Hz时,Xc=2.894k,X_(CR)=3.518k,I_(CP)=17.5mA,V_(CP)=51V,V_(RP)=35V;R功耗≤300mW;(2)f=50Hz时X_C=1.447k,X_(CR)=2.468k,I_(CP)=25mA,V_(CP)=36V,V_(RP)=50V;R功耗≤600mW,即增至2倍;VD增加功耗约130mW。故R、VD有可能受损减寿。此时为保
The 97th issue of 97 “Ringing signal easy” article, talking about the use of peak 90V, 50Hz power for telephone ring test, the author is worried about the impact on the life of components within the machine, the possibility of damage to components. Take HA868 (Ⅲ) P / TSD ringing circuit as an example. as the picture shows. (C) = 51V, V RP = 35V; R work (1) the blocking capacitor C at f = 25Hz, Xc = 2.894k, X CR = 3.518k, I CP = 17.5mA, Consumption is less than or equal to 300mW; (2) X_C = 1.447k at f = 50Hz, X_CR = 2.468k, I_CP = 25mA, V_CP = 36V and V_RP = 50V; , That is, increased to 2 times; VD increased power consumption of about 130mW. Therefore, R, VD may be damaged longevity. At this point to protect