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存储器内建自测试 (memorybuilt-inself-test,MBIST)是一种有效的测试嵌入式存储器的方法 .在一款通用CPU芯片的可测性设计 (design -for-testability ,DFT)中 ,MBIST作为cache和TLB的存储器测试解决方案被采用 ,以简化对布局分散、大小不同的双端口SRAM的测试 .5个独立的BIST控制器在同一外部信号BistMode的控制下并行工作 ,测试结果由扫描链输出 ,使得测试时间和芯片引脚开销都降到最小 .所采用的march 13n算法确保了对固定型故障、跳变故障、地址译码故障和读写电路的开路故障均达到 10 0 %的故障覆盖率 .
Memorybuilt-in-test (MBIST) is an effective way to test embedded memory. In a design -for-testability (DFT) of a general purpose CPU chip, Cache and TLB memory test solutions are used to simplify the distribution of scattered, different size dual-port SRAM test .5 independent BIST controller in the same external signal under the control of BistMode work in parallel, the test results from the scan chain output , Which minimizes test time and chip pin overhead.The march 13n algorithm used ensures that 100% fault coverage is reached for fixed faults, transition faults, address decoding faults, and open-circuit faults in read / write circuits Rate.