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光学薄膜对入射光的弱吸收特性是评价元件质量的重要参数。在高能激光作用下,即使十分微弱的吸收也将足以导致薄膜元件的灾难性破坏。因此,有必要对光学薄膜的平均吸收及局部吸收进行精确、快速、实时的检测。从光热偏转技术发展而来的表面热透镜法由于其对测试装置要求的放宽,并且同样拥有较高的测试精度,是测试元件薄膜弱吸收特性的有效方法之一。通过建立实验系统,测试并确定了各个装置参数在不同设置情况下弱吸收信号的稳定性及强度,从而为测试装置的固化提供了关键的布局数据,并在此实验系统上开展了初步的弱吸收测试实验。
The weak absorption characteristics of the optical film to the incident light is an important parameter for evaluating the quality of the component. Under the action of a high-energy laser, even very weak absorption will be sufficient to cause catastrophic damage to the thin-film elements. Therefore, it is necessary to detect the average absorption and local absorption of the optical film accurately, rapidly and in real time. The surface thermal lens method developed from photothermal deflection technology is one of the effective methods to test the weak absorption characteristics of the elemental thin film due to the relaxation of the required testing device and the same high testing accuracy. Through the establishment of the experimental system, the stability and strength of the weakly absorbed signals of various device parameters were tested and determined, which provided the key layout data for the curing of the test device. The initial weakness Absorption test experiment.