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采用Nd:YAG固体激光器在SrTiO3(STO)衬底上成功制备了具有c轴取向的过掺杂La1.8Sr0.2CuO4和欠掺杂La1.9Sr0.1CuO4超导薄膜。分别对薄膜的晶体结构、电学输运性能进行了研究。通过晶体结构分析表明超导薄膜沿<001>晶向生长,沉积后的薄膜超导转变温度(TC)随着薄膜厚度(20～200 nm)的增加而逐渐升高,显示薄膜由二维特征向三维特征过渡。在双层薄膜La1.8Sr0.2CuO4/La1.9Sr0.1CuO4结构中,其电学输运性能和所加电场的方向有很大关联,反映出电场的方向影响了超导薄膜中空穴载流子的扩散,进而影响了薄膜的超导转变温度和电学输运性能。
The over-doped La1.8Sr0.2CuO4 and undoped La1.9Sr0.1CuO4 superconducting thin films with c-axis orientation were successfully prepared on SrTiO3 (STO) substrate by Nd: YAG solid state laser. The crystal structure and electrical transport properties of the films were investigated respectively. The crystal structure analysis shows that the superconducting thin films grow in the <001> crystal orientation. The superconducting transition temperature (TC) of the films increases with the increase of the film thickness (20-200 nm) Transition to 3D features. In the bilayer thin film La1.8Sr0.2CuO4 / La1.9Sr0.1CuO4, the electrical transport properties are strongly related to the direction of the applied electric field, which indicates that the direction of the electric field affects the charge carrier of the hole in the superconducting thin film Diffusion, thereby affecting the film superconducting transition temperature and electrical transport properties.