在X射线荧光分析,尤其是能量色散X射线荧光分析中常常使用相对测量方法。除了这一方法简单易行之外,主要是它避免了待测元素物理性质、激发源能量和强度、探测器特性以及几何因素等测量困难和现有参数数据不准确等引入的误差。其实质是在同一条件下,认为待测样品和标样中的待测元素含量比与特征谱线强度比相等: Relative measurement methods are often used in X-ray fluorescence analysis, especially in energy dispersive X-ray fluorescence analysis. In addition to this method is simple and easy, mainly because it avoids the physical properties of the element under test, the excitation source energy and intensity, detector characteristics and geometric factors such as measurement difficulties and inaccurate data of the existing parameters such as the introduction of error. In essence, under the same conditions, it is considered that the ratio of the content of the to-be-detected element in the sample under test and the standard sample is equal to the intensity ratio of the characteristic spectrum: