论文部分内容阅读
论述了极小子样高可靠(长寿命)电子设备可靠性验证的困难及国内外对其研究的发展动态;提出了一种工程上实用的验证方法;并给出了一个应用实例。
This paper discusses the difficulty of the reliability verification of the ultra-small high-reliability (long-life) electronic equipment and the development of its research both at home and abroad. An engineering practical verification method is presented. An application example is also given.