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基于干涉粒子成像(IPI)测量公式,分析了影响IPI系统中最大和最小可测粒子尺寸以及粒径测量精度的因素。对一给定的CCD、成像透镜、入射光波波长、光束宽度,分析了物距和离焦距离对粒子干涉条纹图大小的影响,进而分析了对粒径测量精度和可测范围的影响。得出了在满足测量范围要求的条件下,尽量采用相对较大的收集角,干涉条纹图尺寸越大,粒径测量误差越小,但必须考虑条纹图重叠,且对条纹间距进行插值得到亚像素精度,给出了对标准粒子测量实验光路系统设计实例和测量结果。
Based on the interferometric particle imaging (IPI) measurement formula, the factors influencing the maximum and minimum measurable particle size and particle size measurement in IPI system are analyzed. For a given CCD, imaging lens, incident light wavelength and beam width, the influence of object distance and defocus distance on the size of particle interference fringe pattern is analyzed. Then the influence on particle size measurement accuracy and measurable range is analyzed. It is concluded that the larger the collection angle, the larger the size of the interference fringe pattern is and the smaller the measurement error of the particle size is. However, it is necessary to consider the overlap of the fringe patterns and the interpolation of the fringe spacing Pixel accuracy, given the standard particle measurement experiment light path system design examples and measurement results.