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本文应用DTA及X射线衍射法在常压及高压下对—种含SiO_2的锂离子导体玻璃0.3Li_2O-0.67SiO_2-0.03V_2O_5加热时的晶化行为进行了研究。该氧化物玻璃的晶化过程分两个阶段。在常压下,第一晶化过程发生在560℃ 附近,析出相为Li_2O·2SiO_2。对应的晶化温度T_(x1)随压力的升高发生了急剧的变化。从常压到0.3GPa,T_(x1)从560℃升高到620℃;继续升压时T_(x1)突然下降,并在0.4GPa处跌到528℃,呈现一个陡削的峰值。0.4GPa以上,T_(x1)随压力的变化则呈常规行为,比较平稳地、大致线性地升高,一直到最高测定压力2GPa。本文最后对这些行为的可能原因进行了讨论。
In this paper, DTA and X-ray diffraction methods were used to study the crystallization behavior of a kind of lithium ion conductor glass containing 0.3Li2O-0.67SiO2-0.03V2O5 at atmospheric pressure and high pressure. The crystallization process of the oxide glass is divided into two stages. At atmospheric pressure, the first crystallization process occurs near 560 ℃, the precipitated phase is Li_2O · 2SiO_2. The corresponding crystallization temperature T_ (x1) changes sharply with the increase of pressure. From atmospheric pressure to 0.3GPa, T_ (x1) increased from 560 ℃ to 620 ℃. At the time of increasing pressure, T_ (x1) suddenly dropped and dropped to 528 ℃ at 0.4GPa, showing a steep peak. 0.4GPa above, T_ (x1) changes with pressure was normal behavior, relatively smooth, roughly linear rise until the maximum measured pressure 2GPa. This article concludes with a discussion of possible causes of these actions.