用氦质谱加压真空法检测双密封结构产品漏率时 ,常有“缓慢升高”现象的发生 ,必需解决这一读数困难的问题。建立了双密封结构泄漏过程的数学模型 ,从而在理论上解释了此类现象发生的原因 ,并编制程序后对一些具体结构进行了分析计算。这对确定检漏时间和相应的数据处理方法有一定的指导意义 Helium mass spectrometry pressurized vacuum test double seal structure product leakage rate, often “slow increase” phenomenon, we must solve the problem of reading difficulties. The mathematic model of the leakage process of the double-seal structure is established, which explains the reason of such phenomenon in theory and some specific structures are analyzed and calculated after the program is compiled. This is to determine the leak time and the corresponding data processing methods have some guiding significance