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本文介绍了运用正交试验法于ＺＣＫ系列高速开关二极管的制作，寻找到理想的工艺配方组合，攻克了ＺＣＫ二极管瓷片裂纹的难关，取得了较好的经济效益。
This article describes the use of orthogonal test method ZCK series of high-speed switching diodes in the production, to find the ideal combination of process recipe to overcome the difficulties ZCK diode chip cracks, and achieved good economic benefits.