近十余年来,X射线化学分析法已被广泛采用。利用X射线进行化学分析,有三类不同方法:衍射分析法,发射光谱分析法和吸收分析法。衍射分析法常称物相分析,它是根据晶态物质的X射线衍射花样的特征和衍射线的强度来进行定性与定量分析的。分析结果直接给出样品中所含晶体的种类、数目及其相对含量。非晶态物质沒有一定的衍射花样,故不能用此法分析。发射光谱分析法(包括初级发射光谱法及熒光X光谱分析法)的原理与通常的光学光谱分析法相同,是根据各种元素所固有的特征X射线的波长及强度来进行定性定量分析的,分析结果给出样品中所含元素的种类及含量。上述二法本刊已先后作过介绍,本文之目的是要对吸收分析法的原理、设备及应用作一简要介绍。 The past decade, X-ray chemical analysis has been widely used. There are three different types of chemical analysis using X-ray: diffraction analysis, emission spectroscopy, and absorption analysis. Diffraction analysis is often referred to as phase analysis. It is based on the characteristics of X-ray diffraction patterns of crystalline materials and the intensity of the diffraction lines for qualitative and quantitative analysis. The result of the analysis directly gives the type, number and relative content of the crystals contained in the sample. Amorphous material does not have some diffraction patterns, it can not be analyzed by this method. The principles of emission spectroscopy (including primary emission spectroscopy and fluorescence X-ray spectrometry) are the same as those of the conventional optical spectroscopy, and are qualitatively and quantitatively analyzed based on the wavelengths and intensities of the characteristic X-rays inherent in various elements. Analysis results show the type and content of the elements contained in the sample. The above two law publications have been introduced, the purpose of this article is to absorb the principle, equipment and application of a brief introduction.