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通过构造Koch曲线岛对剖面小岛法测得的分维的准确性和可靠性进行了研究，并研究了Koch曲线岛的初始边长、形状和嵌套层次等构造因素对分维测量的影响．结果表明，剖面小岛法不适合于作为纳米度域的分维测量方法．
The accuracy and reliability of the fractal dimension measured by the island method are studied by constructing the Koch curve island, and the influence of structural factors such as initial edge length, shape and nesting level of Koch curve island on the fractal dimension measurement . The results show that the cross-sectional island method is not suitable as a fractal dimension method for the nano-scale domain.