利用远场成像及标定对比方法,建立了半导体激光器慢轴远场分布的CCD测量系统。介绍了测量的原理和测量系统的组成,并给出了半导体激光器慢轴远场分布的测量结果。实验结果表明,该方法实时性好,测量快速、准确,人为误差因素少,适合仪器化。 Using far-field imaging and calibration contrast method, a CCD measurement system for far-field distribution of slow lasers in semiconductor lasers is established. The principle of the measurement and the composition of the measurement system are introduced. The measurement results of the far-field distribution of the slow axis of the semiconductor laser are also given. Experimental results show that this method has good real-time performance, fast and accurate measurement, less human error and suitable for instrumentation.