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本文阐述一种应用SDK—85单构机设计而成的数字集成电路测试仪,它适用于14—24脚的中小规模TTL,CMOS电路以及一部分大规模集成电路器件的功能测试。各种测试信号均用软件产生,系统专用硬件少。测试软件较为简练。整机性能试验表明,仪器使用方便,对操作者无特殊要求,测试快速可靠,可测器件品种广泛。系统还备有测试图形检查程序供编制器件测试图形检验之用。文中还简要地论述了测试图形码组的设计原理、要点,并附有二个实例供设计时参考。
This article describes a digital integrated circuit tester designed with the SDK-85 single-chip processor, which is suitable for functional testing of 14-24-pin mid- and small-scale TTL, CMOS circuits and some large scale integrated circuit devices. A variety of test signals are generated using software, system-specific hardware less. Test software more concise. Machine performance tests show that the instrument is easy to use, no special requirements for the operator, the test is fast and reliable, a wide range of measurable devices. The system is also equipped with a test graphics inspection program for the preparation of device test graphics inspection purposes. The paper also briefly discusses the design principles of test pattern code, key points, and with two examples for the design of reference.