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半导体存储器的生产表明,大量功能失效的芯片仅仅由于个别单元、或一行、一列失效,只要将这极少数失效单元剔除,则芯片仍可正常工作。分区替换法采取在存储系统设计时增加冗余组件的办法对部分单元失效存储组件中的失效单元实行替换,从而可使年导体存储器件的可用率提高2～3倍。本文详细论述了分区替换原理及实施方案;立足于国产测试仪提出了部分单元失效存储组件的测试方法;运用成品率模型讨论了分区替换法对可用率的贡献。分区替换法方法简便,代价小,效果好,尤其适用于成品率不高的半导体存储器。
The production of semiconductor memory shows that a large number of failed chips can only function as a single unit or a row or column fails as long as the very few failed cells are removed. Partition replacement method adopted in the storage system design to increase the redundant components of the failure of some of the unit failure to replace the storage unit failure, which can make the annual conductor storage device availability increased by 2 to 3 times. In this paper, the principle of partition replacement and its implementation plan are discussed in detail. Based on the domestic tester, some test methods of failure memory components are put forward. The contribution of partition replacement method to the availability rate is discussed by using the yield model. Partition replacement method is simple, small cost, good effect, especially for low yield semiconductor memory.