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在X射线残余应力的测定中,试样的表面处理是十分关键的问题。在测定残余应力时,X射线在试样表面的贯穿深度很小,一般仅十几微米至几十微米,也就是只测定试样表面几十微米内的残余应力值。可见试样表面几十微米内的状态,对测定应力值的正确性有很大影响。本文扼要介绍试样表面处理对测定值的影响以及电解抛光的方法和设备。
In the determination of X-ray residual stress, the sample surface treatment is a very crucial issue. In the determination of residual stress, X-ray penetration depth in the sample surface is very small, usually only a few ten microns to tens of microns, that is, only the surface of the sample measured tens of microns residual stress value. Visible sample surface within the state of tens of microns, the correctness of the measured stress value has a great impact. This article briefly describes the impact of sample surface treatment on the measured value as well as electrolytic polishing method and equipment.