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本文根据悬臂梁式压电双晶片的动态导纳矩阵 ,提出一种压电材料参数动态测试模型 ,用于测量压电双晶片的几个主要材料参数 :压电应变常数d31、机电耦合系数k31、介电常数εT33、弹性柔顺系数SE11及材料参数的温度特性。本文的这种测量方法不同于通常的由标准试样测量压电材料参数的方法 ,是直接由一种实用元件—压电双晶片 (非标准试样 )测量压电材料的参数。文中详细描述了测试原理、测试步骤及一种实际试样的测试结果。理论与实验结果表明 :这种新的测试方法是可行的。
In this paper, based on the dynamic admittance matrix of cantilever piezoelectric bimorphs, a piezoelectric material dynamic testing model is proposed to measure several main material parameters of piezoelectric bimorph: piezoelectric strain constant d31, electromechanical coupling coefficient k31 , Dielectric constant εT33, elastic compliance coefficient SE11 and the temperature characteristics of material parameters. This method of measurement differs from the usual method of measuring piezoelectric material parameters from a standard specimen by measuring the piezoelectric material directly from a practical element, a piezoelectric bimorph (non-standard specimen). The article describes in detail the test principle, test procedures and test results of a real sample. Theoretical and experimental results show that this new test method is feasible.