在电子探针分析中,无论是元素的定性分析或是定量分析,都希望得到尽可能高的元素特征X射线强度和尽可能低的背底强度,即希望得到元素特征X射线的最佳峰背比(L/B)。本文根据电子与物质相互作用的原理,提出几种提高元素特征X射线强度及其峰背比的方法。 In the electronic probe analysis, both the qualitative analysis of elements or quantitative analysis, are expected to get the highest possible elemental characteristic X-ray intensity and as low as possible the strength of the back ground, that is, the best hope to get the elemental characteristic X-ray Back than (L / B). Based on the principle of the interaction between electrons and matter, several methods to improve the X-ray intensities of elements and their peak-to-background ratios are proposed.