自１９９１年起，我们利用场致发射显微分析综合系统￣［１］，开始了场致负离子发射方面的研究，一些初步的结果￣［２］［３］宣布之后，引起了同行的重视和争论，为进一步证实所获得的离子为负离子，我们采用在探测器前端加偏压的方法，对所获取的离子的正负性进行了检测。实验结果与理论估算相符合，证实采用在样品上加负脉冲、正偏条件下所获得的离子不是正离子。 Since 1991, we started the study of field-induced negative ion emission by using the field emission microanalysis synthesis system [1]. Some preliminary results [2] [3] Arguably, in order to confirm that the obtained ions are negative ions, we detected the positive and negative of the obtained ions by applying a bias at the front of the detector. The experimental results are consistent with the theoretical estimates, confirming the use of negative impulses on the sample, the ions obtained under positive bias are not positive ions.