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一、前言随着格雷(Gray)和霍克(Houk)的开创性工作,近来在市场上出现了两种用电感耦合等离子体作为离子源的质谱分析仪器(ICP-MS)。与采用ICP作光源的发射光谱法(ICP-ES)比较,这种新技术对“实在样品”(即具有复杂基体性质的材料)中痕量元素测定的应用就少得多了。在这个分析领域内需要相当长的时间,人们才能象了解ICP-ES那样来了解ICP-MS,因为ICP-ES在有些实验室中日常使用已近二十年了。设在哈威尔(Harwell)的我们的实验
I. INTRODUCTION With the pioneering work of Gray and Houk, two types of mass spectrometry (ICP-MS) instruments using inductively coupled plasma as an ion source have recently appeared on the market. Compared with ICP-ES, which uses ICP as the light source, the new technique is much less useful for the determination of trace elements in “real samples” (ie, materials with complex matrix properties). It takes a long time in this area of analysis for people to understand ICP-MS as they did for ICP-ES because ICP-ES has been used daily for nearly two decades in some laboratories. Our experiment at Harwell