In order to improve the test accuracy of CCD,a new type of CCD device is proposed.Several columns(rows) of photoelectric diodes(PDs) are combined together,and staggered with the distance of H1=H/N,where H is the space between two adjacent PDs,and N is the number of columns(rows).The photoelectric signals are collected simultaneously by multi-channel A/D,and the accurate measurement result is obtained through appropriate signal processing.Without changing the size or space of PDs,more photographic pixels are arranged in the given direction within a finite length.Diameters of three standard poles are measured by a single CCD and two staggered CCDs,respectively with length of 30 mm and diameters of 5 mm,8 mm and 12 mm,respectively.The results show that the accuracy of double staggered CCDs is two times of that of single CCD.The new type of CCDs can avoid the impact of PD space theoretically and higher measurement accuracy can be obtained. In order to improve the test accuracy of CCD, a new type of CCD device is proposed. Sections (rows) of photoelectric devices (PDs) are combined together and staggered with the distance of H1 = H / N, where H is the space between two adjacent PDs, and N is the number of columns (rows). The signals are collected simultaneously by multi-channel A / D, and the accurate measurement result is obtained through the appropriate signal processing. How to change the size or space of PDs, more photographic pixels are arranged in the given direction within a finite length. Diameters of three standard poles are measured by a single CCD and two staggered CCDs, respectively with length of 30 mm and diameters of 5 mm, 8 mm and 12 mm, respectively. The results show that the accuracy of double staggered CCDs is two times of that of single CCD. the new type of CCDs can avoid the impact of PD space theoretically and higher measurement accuracy can be.