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介绍在北京同步辐射装置上进行的国内首次ＬＬＬ型Ｘ射线干涉实验研究，在Ｘ光底片上观察到了Ｍｏｉｒｅ干涉条纹，为进一步利用Ｘ射线干涉技术实现纳米测量打下了初步基础。
In this paper, the first LLL-type X-ray interference experiment conducted in Beijing Synchrotron Radiation Facility was introduced. Moire interference fringes were observed on the X-ray film, laying a preliminary foundation for the further use of X-ray interference technology to achieve nanometer measurement.