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物理不可克隆函数(Physical Unclonable Function,PUF)电路利用结构完全相同的电路在制造过程中存在的随机工艺偏差,产生具有唯一性、随机性和不可克隆性的密钥。该文通过对共源共栅电流镜的研究,提出一种基于电流镜工艺偏差的多端口可配置PUF电路。该PUF电路由输入寄存器、偏差电压源、复用网络、判决器阵列和扰乱模块构成,通过激励信号配置偏差电压源,无需更换硬件便可实现输出密钥的变化,且可在一个时钟周期内输出多位密钥。在SMIC 65 nm CMOS工艺下,采用全定制方式设计具有36个输出端口的PUF电路,版图面积为24.8μm×77.4μm。实验结果表明,该PUF电路具有良好的唯一性和随机性,且工作在不同温度(-40~125°C)和电压(1.08~1.32 V)下的可靠性均大于97.4%,可应用于信息安全领域。
The Physical Unclonable Function (PUF) circuit utilizes random process variations existing in the manufacturing process of identical circuits to produce a unique, random and unclonable key. In this paper, through the research of cascode current mirror, a multi-port configurable PUF circuit based on current mirror process deviation is proposed. The PUF circuit consists of an input register, a bias voltage source, a multiplexing network, an arbiter array and a jammer module. The bias voltage source is configured by the excitation signal so that the output key can be changed without hardware replacement and can be changed within one clock cycle Output multi-bit key. In the SMIC 65 nm CMOS process, the PUF circuit with 36 output ports is designed in a fully customizable manner with a footprint of 24.8 μm × 77.4 μm. The experimental results show that the PUF circuit has a unique uniqueness and randomness, and the reliability of the PUF circuit is higher than 97.4% under different temperatures (-40 ~ 125 ° C) and voltages (1.08 ~ 1.32 V), which can be applied to information Security area.