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本文介绍利用C扫描技术检验复合材料中的缺陷。根据A扫描缺陷波形的位置和特点,不仅能确定缺陷的埋藏深度,还可以辨别缺陷的性质。并对频谱技术和孔隙含量的测定,进行了初步试验。
This article describes the use of C-scan technology to examine defects in composites. According to the position and characteristics of the A-scan defect waveform, it not only can determine the buried depth of the defect, but also can identify the nature of the defect. A preliminary experiment was carried out on the determination of spectrum technology and pore content.