首先分析了引起CCD非均匀性的原因,将其归纳为两个方面,一为因制作工艺、材料、偏置等因素引起的空间噪声,二为CCD响应特性随时间的漂移而引起的时间噪声,两者的共同作用将严重影响CCD的测量性能。为了能够定量描述空间噪声和时间噪声对CCD产生非均匀性的影响,文中基于CCD光电响应曲线呈线性状态这一假设建立了CCD光电响应的数学模型,然后在该模型的基础上提出了利用最小二乘法来估计校正系数,从而消除CCD的非均匀性,实验证明该算法是有效的。 Firstly, the causes of nonuniformity of CCD are analyzed, which are summarized as two aspects, one is the space noise caused by the manufacturing process, the material and the bias, and the other is the time noise caused by the drift of CCD response characteristics over time , The combined effect of both will seriously affect the measurement performance of CCD. In order to quantitatively describe the influence of space noise and time noise on the nonuniformity of CCD, a mathematical model of photoelectric response of CCD is established based on the assumption that CCD photoelectric response curve is in a linear state. Based on the model, Two-factor method to estimate the correction coefficient, thus eliminating the CCD non-uniformity, experiments show that the algorithm is effective.