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利用ＡＦＭ对在（１００）和与（１００）有６°切偏角的ＳｒＴｉＯ３基片上用射频溅射方法制备的高温超导Ｂｉ２Ｓｒ１．６Ｌａ０．４ＣｕＯ６＋δ（Ｂｉ２２０１）薄膜的生长模式进行了系统地研究。对应以上两类不同切割的基片，实验观察到两种不同的薄膜生长模式。对切偏角小于０．４°的（１００）ＳｒＴｉＯ３基片，本征的生长模式是梯田岛模式（Ｖｏｌｍｅｒ－Ｗｅｂｅｒ模式），每层的厚度为ｃ／２（１．２５ｎｍ）；在切偏角为６°的衬底上沉积的Ｂｉ２２０１薄膜则以台阶流模式（Ｓｔｅｐ－ｆｌｏｗｍｏｄｅ）生长。Ｂｉ系高温超导体的本征的二维特性决定了薄膜的生长模式。
The growth mode of high-temperature superconducting Bi2Sr1.6La0.4CuO6 + δ (Bi2201) thin films prepared by radio frequency sputtering on (100) and SrTiO3 substrates with (100) 6 ° off-angles was systematically investigated by using AFM. Corresponding to the above two kinds of different cutting substrate, the experiment observed two different modes of film growth. For the (100) SrTiO3 substrate with a declination of less than 0.4 °, the intrinsic growth mode is the terraced island model (Volmer-Weber model) with a thickness of c / 2 (1.25 nm) per layer; The Bi2201 thin film deposited on a substrate with a 6 ° angle is grown in a step-flow mode. The inherent two-dimensional nature of the Bi-based high temperature superconductor determines the growth mode of the film.