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CdTe nanocrystalline thin films have been prepared on glass,Si and Al2O3 substrates by radio-frequency magnetron sputtering at liquid nitrogen temperature.The crystal structure and morphology of the films were characterized by X-ray diffraction(XRD)and field-emission scanning electron microscopy(FESEM).The XRD examina-tions revealed that CdTe films on glass and Si had a better crystal quality and higher preferential orientation along the(111)plane than the Al2O3.FESEM observations revealed a continuous and dense morphology of CdTe films on glass and Si substrates.Optical properties of nanocrystalline CdTe films deposited on glass substrates for different deposited times were studied.
CdTe nanocrystalline thin films have been prepared on glass, Si and Al2O3 substrates by radio-frequency magnetron sputtering at liquid nitrogen temperature. Crystal structure and morphology of the films were characterized by X-ray diffraction (XRD) and field-emission scanning electron microscopy (FESEM). The XRD examina-tions revealed that CdTe films on glass and Si had a better crystal quality and higher preferential orientation along the (111) plane than the Al2O3.FESEM observations revealed a continuous and dense morphology of CdTe films on glass and Si substrates.Optical properties of nanocrystalline CdTe films deposited on glass substrates for different deposited times were studied.