测试集成电路芯片,目前尚停留在手动或半自动状态,探针台走步和变换方向都需要摇动手柄或人工按钮,按一次,探针台动作一次。本文将叙述采用 SDK-85单板机控制较为普遍使用的 TZ-3型多探针测试仪,测试芯片电路图形。芯片上所有的电路测 Test integrated circuit chip, still remain in manual or semi-automatic state, probe station walking and changing direction need to shake the handle or manual button, press once, probe station moves once. This article will describe the use of SDK-85 single-board control TZ-3 multi-probe tester is more commonly used to test the chip circuit graphics. Chip all the circuit test