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功耗分析是一种有效的密码芯片侧信道攻击方法,攻击者不需要清楚芯片的内部信息,仅通过监测芯片的功耗曲线就可以分析出卡片内的密钥,对智能卡的安全构成极大威胁。为了测试智能卡的安全性,搭建了TH-PAP-01平台。该平台由PC机、示波器、读卡器、转接卡以及相应的平台控制程序和功耗数据分析软件组成,平台能够与读卡器通信并采集智能卡的功耗信息,在200M Sa/s采样率下每小时可采集2 400条功耗曲线。对采集功耗信号的转接卡做了优化设计,将攻破一款三重数据加密算法(triple data encryption standard,TDES)智能卡芯片需要的功耗曲线条数从80 000条降低到40 000条,系统的信噪比提高为原来的约3.8倍。对另一款TDES智能卡在12 000条功耗曲线时就实现了128位密钥信息的提取。TH-PAP-01功耗分析平台可以满足智能卡安全性分析要求,通过适当的扩展,该平台还可以实现对智能卡的电磁分析功能。
Power consumption analysis is an effective cryptographic chip-side channel attack method. The attacker does not need to know the internal information of the chip. Only by monitoring the power consumption curve of the chip, the key inside the card can be analyzed, which makes the security of the smart card extremely large Threats. In order to test the security of smart card, built the TH-PAP-01 platform. The platform consists of a PC, an oscilloscope, a card reader, a riser card, and corresponding platform control programs and power consumption data analysis software. The platform can communicate with the card reader and collect the power consumption information of the smart card. At a sampling rate of 200M Sa / s Rates can be collected per hour 2,400 power consumption curve. Optimized design of the riser card for collecting power consumption signals reduced the number of power curves needed to break a triple data encryption standard (TDES) smart card chip from 80,000 to 40,000. The system The signal to noise ratio increased by about 3.8 times the original. For another TDES smart card, 128-bit key information is extracted at 12,000 power curves. TH-PAP-01 power analysis platform to meet the smart card security analysis requirements, through the appropriate expansion, the platform can also be achieved on the smart card electromagnetic analysis capabilities.