论文部分内容阅读
近十几年来,随着高分辨率半导体探测器的发展,多道能谱分析仪的使用以及微型计算机技术的应用,在X射线荧光分析(X-RF)技术中形成一种独立的分析方法,即能量色散X射线荧光多元素分析(以下简称EDXRF)。它是通过对特征X射线的能谱和强度的测定来进行元素定性定量分析的。在不少方面可与传统的波长色散分析法相媲美。
In recent decades, with the development of high-resolution semiconductor detectors, the use of multi-channel spectrum analyzers and the application of microcomputer technology, a separate analytical method has been developed in X-ray fluorescence analysis (X-RF) , That is, energy dispersive X-ray fluorescence multi-element analysis (hereinafter referred to as EDXRF). It is through the determination of the characteristic X-ray spectrum and intensity qualitative and quantitative elemental analysis. In many ways comparable with the traditional wavelength dispersion analysis method.