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纽扣电极型探头主要用于束流横向位置测量,在拾取束流信号的同时会存在发热形变问题,有可能引入额外的系统测量误差,极端情况下甚至会导致设备损坏,在强流电子储存环的设计和运行中对此问题需要加以研究。介绍了上海光源储存环纽扣电极的束流负载热效应的分析建模方法,对不同束流流强、不同填充模式下的电极发热问题进行了ANASYS仿真分析。结果表明,在上海光源所有设计运行模式下,电极因束流负载引起的发热形变均小于加工公差,对位置测量的影响可基本忽略,但极端情况下探头内的温度可达270°C,存在一定的设备损坏风险,需要提出相应对策。
The button electrode type probe is mainly used for measuring the lateral position of the beam. There is a problem of heating deformation while the beam signal is being picked up, which may introduce additional system measurement error and may even cause equipment damage in extreme conditions. The design and operation of this issue needs to be studied. The analysis and modeling method of the beam load thermal effect of the button electrode in the storage ring of Shanghai Light Source was introduced. The ANASYS simulation of the electrode heating problem under different beam currents and different filling modes was carried out. The results show that under all design operating modes of Shanghai Light Source, the heating deformation caused by the beam load is less than the processing tolerance, and the influence on the position measurement can be neglected. However, under extreme conditions, the temperature inside the probe can reach 270 ° C, Certain equipment damage risk, need to put forward corresponding countermeasure.