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通过电导率测量、金相观察、扫描电镜分析和X射线衍射分析,研究了Si含量、Cu含量和热处理工艺对Al-Si系铸造合金晶格常数和电性能的影响规律。结果表明:Si和Cu元素的添加会减小合金的电导率;当Si含量超过固溶极限后,Si含量的变化对晶格畸变程度影响不大,合金的电导率受Si相的体积百分数控制;而Cu在固溶极限内时,随其含量的增加,晶格畸变程度增大,合金的电导率可根据铝基体晶格常数的偏离量来评估;经过450℃,5 h+250,2 h热处理工艺,晶格畸变程度明显降低,合金的电导率有明显提高,增幅最高可达32%。
The influence of Si content, Cu content and heat treatment process on the lattice constant and electrical properties of Al-Si cast alloy was studied by means of electrical conductivity measurement, metallographic observation, scanning electron microscopy and X-ray diffraction analysis. The results show that the addition of Si and Cu can reduce the conductivity of the alloy. When the Si content exceeds the solid solution limit, the variation of Si content has little effect on the degree of lattice distortion. The conductivity of the alloy is controlled by the volume fraction of Si phase ; While Cu is within the solid solution limit, the degree of lattice distortion increases with the increase of its content. The conductivity of the alloy can be evaluated according to the deviation of the lattice constant of the aluminum matrix. After 450 ℃, 5 h + 250, 2 h heat treatment process, the degree of lattice distortion is significantly reduced, the conductivity of the alloy has significantly increased, the maximum increase of up to 32%.