一、引言在化工、冶金和其它学科的 X 射线定量相分析工作中,常会遇到样品数量很少的情况。因此,微量样品的研究工作开始受到了重视。文献[1] [2] 曾指出,在联用自动可调光栏的条件下,采用极薄平板样品是可能的,并且给出衍射线强度与样品各物相的 I. INTRODUCTION In the X-ray quantitative phase analysis of chemical industry, metallurgy and other disciplines, there is often a small number of samples. Therefore, the research of trace samples began to be valued. It has been pointed out in [1] and [2] that it is possible to use very thin slab samples in combination with an auto-dimmable diaphragm and to give the diffraction line intensities corresponding to the individual phases of the sample