重位点阵是描述晶界特性的一种重要模型．本文发展了一种测定重位点阵特征参数的ＴＥＭ新方法，其特点是把系统倾转技术和矩阵计算结合起来，这样既避免了菊池极法的局限性，又避免了极图法的不精确性，从而成为一种实用、快速、精确的测定方法 Resetting the lattice is an important model to describe the characteristics of grain boundaries. In this paper, we develop a new TEM method for the determination of the characteristic parameters of the reset bitmap, which is characterized by the combination of the system tilting technique and the matrix calculation. This not only avoids the limitations of the Kikuchi pole method, but also avoids Accuracy, and thus become a practical, rapid and accurate determination of the method