Electrical characteristics of Co/n-Si Schottky barrier diodes are analysed by current-voltage (I- V) and capacitancevoltage (C-V) techniques at room temperature.The electronic parameters such as ideality factor,barrier height and average series resistance are determined.The barrier height 0.76 eV obtained from the C-V measurements is higher than that of the value 0.70 eV obtained from the I-V measurements.The series resistance Rs and the ideality factor n are determined from the d ln( I ) / dV plot and are found to be 193.62Ω and 1.34,respectively.The barrier height and the Rs value are calculated from the H(I) - I plot and are found to be 0.71 eV and 205.95Ω.Furthermore,the energy distribution of the interface state density is determined from the forward bias I-V characteristics by taking into account the bias dependence of the effective barrier height.The interface state density Nss ranges from 6.484×1011 cm-2eV-1 in (Ec-0.446) eV to 2.801×1010 cm-2eV-1 in (Ec-0.631) eV,of the Co/n-Si Schottky barrier diode.The results show the presence of a thin interracial layer between the metal and the semiconductor.